Scanning Electron Microscope
Sample EDS Spectrum
Surface analyses, chemical analysis and imaging on a variety of materials are performed using a Scanning Electron Microscope (SEM). The Scanning Electron Microscope is equipped with an Energy Dispersive Spectrometer (EDS). SEM/EDS provides chemical analysis of the field of view or spot analyses of minute particles. More than 90 elements can be detected with our low-atomic number detector using the SEM/EDS method. This micro-chemical analysis is also a non-destructive test.
Optical Emission Spectrometer
Copper sample during test
Spectrometry (Bulk material analysis and alloy certification):
An alternative to SEM/EDS, the Optical Emission Spectrometry (OES) technique utilizes a high-energy spark created across an argon-filled gap between an electrode and a sample of the material to be analyzed. The spark creates an emission of radiation from the excited sample surface with wavelengths characteristic of the elemental composition. The spectrum of radiation is separated into the distinct element lines and the intensity of each line is measured. Finally, these are precisely converted into concentration values for each element present. Typical applications involve determination of the alloying content of iron and steel, aluminum, copper, nickel, zinc, lead and many other metals and alloys. Optical Emission Spectrometry continues to be the reference technique for direct chemical analysis of solid metallic samples. The unmatched combination of accuracy, high speed, precision, stability and reliability have made it an indispensable tool for production and verification of quality metallurgical products.